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Physics Colloquium, Material characterization at the atomic scale (For when light is just TOO BIG)

Dr. Stephen Exarhos (LU 2012), Senior Microscopy Engineer, Seagate Technology

Characterization of different material properties, including chemical, structural, morphological, optical, electronic, etc., often requires the use of some kind of probe. We can use the probe to perturb the material and by observing the dissipation, absorption, transmission, refraction, reflection, diffraction, or emission in or from that material, we can deduce certain properties. The probe we choose determines the interactions that we can observe. Visible light, for example, is often used because it’s easy to generate and to control. But as we have developed the capability to fabricate smaller and more complex nanoscopic devices, we have needed smaller and smaller probes to characterize those features. Visible light is just too big! In this talk, I will discuss my work using an electron beam as a probe to characterize materials at the atomic scale. Specifically, I will discuss how I have used electron microscopy to support my work in new materials development, chemical kinetics, and device failure analysis.

Location:	Youngchild Hall 115
Contact:	Matthew R. Stoneking matthew.r.stoneking@lawrence.edu
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