BEGIN:VCALENDAR
VERSION:2.0
METHOD:PUBLISH
PRODID:-//Virginia Tech//VTCalendar//EN
BEGIN:VEVENT
DTSTAMP:20240510T145000Z
UID:1715087811106@thor.lawrence.edu
CATEGORIES:Other
DTSTART:20240510T145000Z
DTEND:20240511T045900Z
SUMMARY:Physics Colloquium, Material characterization 
 at the atomic scale (For when light is just TOO 
 BIG)
CONTACT;ALTREP="mailto:matthew.r.stoneking@lawrence.edu":
 Matthew R. Stoneking\, matthew.r.stoneking@lawrence.edu
DESCRIPTION:
 Dr. Stephen Exarhos (LU 2012), Senior Microscopy 
 Engineer, Seagate Technology\n
 \n
 Characterization of different material properties, 
 including chemical, structural, morphological, 
 optical, electronic, etc., often requires the 
 use of some kind of probe. We can use the probe 
 to perturb the material and by observing the dissipation, 
 absorption, transmission, refraction, reflection, 
 diffraction, or emission in or from that material, 
 we can deduce certain properties. The probe we 
 choose determines the interactions that we can 
 observe. Visible light, for example, is often 
 used because itaEUR(TM)s easy to generate and 
 to control. But as we have developed the capability 
 to fabricate smaller and more complex nanoscopic 
 devices, we have needed smaller and smaller probes 
 to characterize those features. Visible light 
 is just too big! In this talk, I will discuss 
 my work using an electron beam as a probe to characterize 
 materials at the atomic scale. Specifically, I 
 will discuss how I have used electron microscopy 
 to support my work in new materials development, 
 chemical kinetics, and device failure analysis.\n\n

LOCATION:Youngchild Hall 115
END:VEVENT
END:VCALENDAR